Yong Woo Jeon

A Novel Self-Aligned 4-Bit SONOS-Type Nonvolatile Memory Cell With T-Gate and I-Shaped FinFET Structure

Dong Myong Kim, Dae Hwan Kim, Tsu-Jae King Liu, 2010, IEEE Transactions on Electron Devices.

NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer

Chong-Gun Yu, Jong-Tae Park, M. Saif Islam, 2009, Microelectron. Reliab..

Localization effect of a current-path in amorphous In–Ga–Zn–O thin film transistors with a highly doped buried-layer

Sang Yeol Lee, Dae Hwan Kim, Yong Woo Jeon, 2011 .

Physical Parameter-Based SPICE Models for InGaZnO Thin-Film Transistors Applicable to Process Optimization and Robust Circuit Design

Dong Myong Kim, Hyuck-In Kwon, Yun Seop Yu, 2012, IEEE Electron Device Letters.

Origin of threshold voltage shift by interfacial trap density in amorphous InGaZnO thin film transistor under temperature induced stress

Sang Yeol Lee, Dae Hwan Kim, Yong Woo Jeon, 2011 .

The Effect of the Active Layer Thickness on the Negative Bias Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors

Dong Myong Kim, Dae Hwan Kim, Yong Woo Jeon, 2011, IEEE Electron Device Letters.

Effect of channel thickness on density of states in amorphous InGaZnO thin film transistor

Sang Yeol Lee, Dae Hwan Kim, Yong Woo Jeon, 2011 .

Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

U-In Chung, Dong Myong Kim, Dae Hwan Kim, 2010, IEEE Transactions on Electron Devices.