D. Niggemeyer

Integration of non-classical faults in standard March tests

J. Otterstedt, D. Niggemeyer, M. Redeker, 1998, Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236).

A defect-tolerant word-oriented static RAM with built-in self-test and self-reconfiguration

P. Nordholz, J. Otterstedt, D. Niggemeyer, 1996, 1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon.

A defect-tolerant DRAM employing a hierarchical redundancy scheme, built-in self-test and self-reconfiguration

J. Otterstedt, D. Niggemeyer, M. Redeker, 1997, Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159).