Gilbert Declerck

发表

Design impact on drain multiplication latch-up triggering

Ludo Deferm, C. Claeys, H. Lebon, 1988 .

The influence of the interface trap density on the performance of bipolar devices

S. Decoutere, Ludo Deferm, C. Claeys, 1989, Proceedings of the Bipolar Circuits and Technology Meeting.

An analytical model for the MISIS structure in SOI MOS devices

Corneel Claeys, Gilbert Declerck, M. R. Tack, 1990 .

Modeling the non-uniformity of base sheet resistivity at high currents in bipolar transistors

S. Decoutere, Ludo Deferm, Corneel Claeys, 1992 .

MOS technology for VLSI

Gilbert Declerck, L. Dupas, K. De Meyer, 1984 .

DC characteristics of submicrometer CMOS inverters operating over the whole temperature range of 4.2-300 K

Ludo Deferm, Gilbert Declerck, E. A. Gutierrez-D, 1992 .

The ADEQUAT project for development and transfer of 0.25 μm logic complementary metal–oxide–semiconductor modules

H. Ryssel, M. Haond, L. Van den hove, 1994 .

Latch-up in a BiCMOS technology

S. Decoutere, Ludo Deferm, C. Claeys, 1988, Technical Digest., International Electron Devices Meeting.

Experimental results on three-phase polysilicon CCD's with a TCE-SiO/SUB 2//Si/SUB 3/N/SUB 4/ gate insulator

J. Van der Spiegel, Gilbert Declerck, Kristin M. De Meyer, 1976 .

Explaining the amplitude of RTS noise in submicrometer MOSFETs

Eddy Simoen, B. Dierickx, C. Claeys, 1992 .

Two- and three-dimensional calculation of substrate resistance

C. Claeys, Ludo Deferm, Gilbert Declerck, 1988 .

High-temperature hydrogen anneal of mnos structures

Herman Maes, Gilbert Declerck, R. Van Overstraeten, 1978 .

The multistable charge-controlled memory effect in SOI MOS transistors at low temperatures

C. Claeys, Gilbert Declerck, M. R. Tack, 1990 .

Development of test structures for silicon particle detectors

Ingrid Debusschere, Gilbert Declerck, Ehm Heijne, 1987 .

Short-channel pMOSTs in a high-resistivity silicon substrate. I. Analytical model

Eddy Simoen, C. Claeys, Gilbert Declerck, 1992 .

STUDY OF DIFFERENT SENSOR TYPES FOR HIGH RESOLUTION LINEAR CCD-IMAGERS

Jan Sevenhans, A. Theuwissen, J. Van der Spiegel, 1984 .

Experimental results on fast surface states and 1/f noise in m.o.s. transistors

Gilbert Declerck, R. Van Overstraeten, G. Broux, 1975 .

Influence of surface potential fluctuations on the operation of a MOS transistor in weak inversion

Gilbert Declerck, R. Van Overstraeten, G. Broux, 1972 .

Theoretical and practical investigation of the thermal generation in gate controlled diodes

Gilbert Declerck, G. Declerck, Jan van der Spiegel, 1981 .

Anomalous kink-related excess noise in MOSFETs at 4.2 K

Eddy Simoen, B. Dierickx, C. Claeys, 1991 .

The influence of the drain multiplication current on latchup behavior

C. Claeys, Ludo Deferm, H. Lebon, 1988 .

Generation lifetime monitoring on high resistivity silicon using gated diodes

Cor Claeys, Ingrid Debusschere, Gilbert Declerck, 1990 .

Characterization of the Mosfet Operating in Weak Inversion

Gilbert Declerck, Roger J. Van Overstraeten, G. Declerck, 1978 .