V. Pilipenko

Current flow through metal shunts in ohmic contacts to n+-Si

N. S. Boltovets, T. V. Petlitskaya, A. Sachenko, 2014 .

Formation of insulating oxygen-containing layer on the silicon wafer surface using low-temperature hydrogenation

S. Kobeleva, A. Patryn, N. Drozdov, 2008 .

Terrogenic effects in the ionosphere: a review

M. Gokhberg, V. Pilipenko, L. Popov, 1989 .

INFLUENCE OF TIME MODES OF THERMAL TREATMENT ON Pt-Si SYSTEM MICROSTRUCTURE

F. Komarov, V. Pilipenko, V. Saladukha, 2020 .

EFFECT OF RAPID THERMAL TREATMENT ТЕMPERATURE ON ELECTROPHYSICAL PROPERTIES OF NICKEL FILMS ON SILICON

V. Pilipenko, J. Solovjov, 2020 .

Features of the Temperature Dependence of the Specific Contact Resistance of Au–Ti–Pd–n+–n-Si Diffusion Silicon Structures

N. S. Boltovets, A. S. Slepova, V. V. Shynkarenko, 2019, Semiconductors.