A. Tian

Reduction of Polarization Field Strength in Fully Strained c-Plane InGaN/(In)GaN Multiple Quantum Wells Grown by MOCVD

F. Zhang, Hui Yang, M. Ikeda, 2016, Nanoscale Research Letters.

Residual Stress Characterization of A7N01-T5 Welds for High Speed Train by X-Ray Diffraction and Verification

G. Gou, Hui Chen, Chuanping Ma, 2011 .

Identification of Degradation Mechanisms Based on Thermal Characteristics of InGaN/GaN Laser Diodes

Hui Yang, M. Feng, Shuming Zhang, 2015, IEEE Journal of Selected Topics in Quantum Electronics.

Tests and Numerical Study of Single-Lap Thermoplastic Composite Joints Bolted by Countersunk

Xiuhua Chen, Jian Zhang, Y. Fan, 2022, Materials.