J. Moragues

New test structure for high resolution leakage current and capacitance measurements in CMOS imager applications

B. Dunne, H. Brut, L. Grant, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).

SURFACE POTENTIAL DETERMINATION IN METAL-OXIDE-SEMICONDUCTOR CAPACITORS

B. Sagnes, R. Jérisian, J. Oualid, 1994 .

Relaxation of the space charge created by Fowler–Nordheim injections in metal–oxide–semiconductor capacitors

D. Vuillaume, B. Sagnes, R. Jérisian, 1996 .

Influence of FN electron injections in dry and dry/wet/dry gate oxides : relation with failure

P. Boivin, B. Sagnes, R. Jérisian, 1995 .

Probing impact on pad moisture tightness: A challenge for pad size reduction

P. Gonon, P. Fornara, J. Jacquot, 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS).