R. Martin

Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

M. Kneissl, M. Weyers, P. Parbrook, 2020, IOP Conference Series: Materials Science and Engineering.

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

P. Parbrook, B. Hourahine, A. Day, 2012, Microscopy and Microanalysis.

Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

M. Kneissl, M. Weyers, Tao Wang, 2019, Photonics Research.

Fabrication and performance of parallel-addressed InGaN micro-LED arrays

R.W. Martin, M. Dawson, C. Jeon, 2003, IEEE Photonics Technology Letters.

AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy

M. Kneissl, M. Bickermann, C. Hartmann, 2020, Journal of Crystal Growth.

A cross-linkable, organic down-converting material for white light emission from hybrid LEDs

D. Wallis, Han Yang, P. Skabara, 2023, Journal of Materials Chemistry C.