Ping-Chung Li

iProbe-d: a hot-carrier and oxide reliability simulator

Ibrahim N. Hajj, Georgios I. Stamoulis, Ping-Chung Li, 1994, Proceedings of 1994 IEEE International Reliability Physics Symposium.

VLSI Design for Reliability-Current Density

Ibrahim N. Hajj, G. Stamoulis, Ping-Chung Li, 1993 .

Computer-aided redesign of VLSI circuits for hot-carrier reliability

Ibrahim N. Hajj, Ping-Chung Li, 1996, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Computer-aided redesign of VLSI circuits for hot-carrier reliability

Ibrahim N. Hajj, Ping-Chung Li, I. Hajj, 1993, Proceedings of 1993 IEEE International Conference on Computer Design ICCD'93.

A simulation and redesign system for circuit hot-carrier reliability

Ping-Chung Li, 1994 .

Current Estimation for Electromigration, Hot Carriers, and Voltage Drop

Ibrahim N. Hajj, Harish Kriplani, Ping-Chung Li, 1994 .

A probabilistic timing approach to hot-carrier effect estimation

Ibrahim N. Hajj, Georgios I. Stamoulis, Ping-Chung Li, 1992, ICCAD.

A probabilistic timing approach to hot-carrier effect estimation

Ibrahim N. Hajj, Georgios I. Stamoulis, Ping-Chung Li, 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Electromigration: the time bomb in deep-submicron ICs

Ping-Chung Li, T. K. Young, Ping-Chung Li, 1996 .