Robert M. Wallace

Robert M. Wallace, Mark S. Rodder, Sunil V. Hattangady, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

Evaluating the minimum thickness of gate oxide on silicon using first-principles method

Robert M. Wallace, Alan Seabaugh, Shaoping Tang, 1998 .

Protonic nonvolatile field effect transistor memories in Si/SiO/sub 2//Si structures

Robert M. Wallace, Daniel M. Fleetwood, Marty R. Shaneyfelt, 1997 .

Pattern transfer of hydrogen depassivation lithography patterns into silicon with atomically traceable placement and size control

Kai Li, Robert M. Wallace, Richard M. Silver, 2014 .

The Role of Oxygen during Thermal Reduction of Graphene Oxide Studied by Infrared Absorption Spectroscopy

Robert M. Wallace, Kyeongjae Cho, Geunsik Lee, 2011 .

Examination of deuterium transport through device structures

Robert M. Wallace, P. J. Chen, 1998 .

Ultrascaled hafnium silicon oxynitride gate dielectrics with excellent carrier mobility and reliability

G. Pant, Robert M. Wallace, S. A. Krishnan, 2005 .

ELECTRICAL PROPERTIES OF HAFNIUM SILICATE GATE DIELECTRICS DEPOSITED DIRECTLY ON SILICON

Robert M. Wallace, Glen D. Wilk, R. Wallace, 1999 .

Stable zirconium silicate gate dielectrics deposited directly on silicon

Robert M. Wallace, Glen D. Wilk, R. Wallace, 2000 .

High-κ gate dielectric materials

Robert M. Wallace, Glen Wilk, 2002 .

Comparison of electrical and chemical characteristics of ultrathin HfON versus HfSiON dielectrics

G. Pant, Robert M. Wallace, Bruce E. Gnade, 2006 .

Detection of Ga suboxides and their impact on III-V passivation and Fermi-level pinning

Robert M. Wallace, Eric M. Vogel, Christopher L. Hinkle, 2009 .

W Te2 thin films grown by beam-interrupted molecular beam epitaxy

Robert M. Wallace, Luigi Colombo, Jiyoung Kim, 2017 .

Electrical Characterization of a Single TiO2 Nanotube by Using Modified FIB/SEM

Robert M. Wallace, Bruce E. Gnade, Jie Huang, 2006, Microscopy and Microanalysis.

Strain-induced ferromagnetism in LaCoO3: Theory and growth on Si (100)

Robert M. Wallace, David J. Smith, Alexander A. Demkov, 2011 .

Dopant penetration studies through Hf silicate

Robert M. Wallace, Bruce E. Gnade, Luigi Colombo, 2005 .

MoS2-Titanium Contact Interface Reactions.

Robert M. Wallace, Christopher M. Smyth, Christopher L. Hinkle, 2016, ACS applied materials & interfaces.

High-κ Dielectric Materials for Microelectronics

Robert M. Wallace, Glen D. Wilk, R. Wallace, 2003 .

Deuterium transport through device structures

Robert M. Wallace, P. J. Chen, 1999 .

MoS2 functionalization for ultra-thin atomic layer deposited dielectrics

Robert M. Wallace, Ning Lu, Kyeongjae Cho, 2014 .

A crystalline oxide passivation for Al2O3/AlGaN/GaN

Robert M. Wallace, Jiyoung Kim, Hong Dong, 2014 .

Contact Engineering High Performance n-Type MoTe2 Transistors.

Eric Pop, Robert M. Wallace, Yoshio Nishi, 2019, Nano letters.

Uniform Wafer-Scale Chemical Vapor Deposition of Graphene on Evaporated Cu (111) Film with Quality Comparable to Exfoliated Monolayer

Robert M. Wallace, Deji Akinwande, Rodney S. Ruoff, 2012 .

Conformal Al2O3 dielectric layer deposited by atomic layer deposition for graphene-based nanoelectronics

Robert M. Wallace, Eric M. Vogel, Kyeongjae Cho, 2008 .

Fermi level unpinning of GaSb (100) using plasma enhanced atomic layer deposition of Al2O3

Suman Datta, Robert M. Wallace, Mantu K. Hudait, 2010 .

Chemical kinetics of mobile-proton generation and annihilation in SiO2 thin films

Robert M. Wallace, George A. Brown, Daniel M. Fleetwood, 1998 .

Interface studies of GaAs metal-oxide-semiconductor structures using atomic-layer-deposited HfO2/Al2O3 nanolaminate gate dielectric

Yi Xuan, Robert M. Wallace, Peide D. Ye, 2007 .

Dual-gate MoS2 transistors with sub-10 nm top-gate high-k dielectrics

Robert M. Wallace, Paul K. Hurley, Chadwin D. Young, 2018, Applied Physics Letters.

The effect of chemical residues on the physical and electrical properties of chemical vapor deposited graphene transferred to SiO2

Robert M. Wallace, Luigi Colombo, Eric M. Vogel, 2011 .

GaAs interfacial self-cleaning by atomic layer deposition

Robert M. Wallace, Eric M. Vogel, Jiyoung Kim, 2008 .