Liu Chen

Transient dual interface measurement — A new JEDEC standard for the measurement of the junction-to-case thermal resistance

Martin Walder, Dirk Schweitzer, Heinz Pape, 2011, 2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

Transient Measurement of the Junction-To-Case Thermal Resistance Using Structure Functions: Chances and Limits

Liu Chen, D. Schweitzer, H. Pape, 2008, 2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

An Experimental study of two approaches to mathematics instruction for pre-first graders

Liu Chen, 1977 .