Takeshi Uruma

Nanoscale observation of organic thin film by atomic force microscopy

N. Satoh, T. Soga, Shota Mochizuki, 2017 .

Investigation of the surface potential and the depletion layer of Silicon-Schottky barrier diode — Evaluation by scanning probe microscopy

N. Satoh, H. Yamamoto, A. Oda, 2016, 2016 19th International Conference on Electrical Machines and Systems (ICEMS).

Investigation on the surface potential and the depletion layer of Si-Schottky barrier diode — Evaluation by numerical calculation

N. Satoh, H. Yamamoto, A. Oda, 2016, 2016 19th International Conference on Electrical Machines and Systems (ICEMS).

Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope

F. Iwata, G. Hashiguchi, K. Nakazawa, 2022, IEEE Transactions on Instrumentation and Measurement.

Development of scanning capacitance force microscopy using the dissipative force modulation method

N. Satoh, F. Iwata, H. Yamamoto, 2019, Measurement Science and Technology.

Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices

N. Satoh, F. Iwata, H. Yamamoto, 2019, AIP Advances.

Investigation of an n− layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy

N. Satoh, F. Iwata, H. Yamamoto, 2018, Japanese Journal of Applied Physics.

Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Hidekazu Yamamoto, Nobuo Satoh, Takeshi Uruma, 2017 .

Evaluation of carrier concentration reduction in GaN-on-GaN wafers by Raman spectroscopy and Kelvin force microscopy

T. Hashizume, N. Satoh, H. Yamamoto, 2017 .