J. Portillo

发表

A Comparison of a Direct Electron Detector and a High-Speed Video Camera for a Scanning Precession Electron Diffraction Phase and Orientation Mapping

S. Nicolopoulos, I. MacLaren, D. McGrouther, 2020, Microscopy and Microanalysis.

Hafnium-Silicon Precipitate Structure Determination in a New Heat-Resistant Ferritic Alloy by Precession Electron Diffraction Techniques

S. Nicolopoulos, N. Llorca-Isern, J. Portillo, 2013, Microscopy and Microanalysis.

EELS signal enhancement by means of beam precession in the TEM

S. Estradé, F. Peiró, J. Rebled, 2012 .

Orientation and phase mapping in the transmission electron microscope using precession‐assisted diffraction spot recognition: state‐of‐the‐art results

M. Gemmi, S. Nicolopoulos, S. Estradé, 2013, Journal of microscopy.

Novel characterization techniques for cultural heritage using a TEM orientation imaging in combination with 3D precession diffraction tomography: a case study of green and white ancient Roman glass tesserae

E. Rauch, S. Nicolopoulos, I. Margiolaki, 2018, Heritage Science.

A novelty for cultural heritage material analysis: Transmission Electron Microscope (TEM) 3D electron diffraction tomography applied to Roman glass tesserae

E. Rauch, S. Nicolopoulos, I. Margiolaki, 2018 .

Ab initio determination of the framework structure of the heavy-metal oxide Cs(x)Nb2.54W2.46O14 from 100 kV precession electron diffraction data.

S. Nicolopoulos, T. Weirich, G. Cox, 2006, Ultramicroscopy.

Automatic Crystal Orientation and Phase Mapping in TEM by Precession Diffraction

Stavros Nicolopoulos, Edgar F. Rauch, E. Rauch, 2008 .

S1431927620024411jra 1110..1116

S. Nicolopoulos, I. MacLaren, D. McGrouther, 2020 .

Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determination.

S. Nicolopoulos, B. Sobolev, N. Martin, 2007, Ultramicroscopy.

Precession Electron Diffraction Assisted Orientation Mapping in the Transmission Electron Microscope

Mauro Gemmi, Stavros Nicolopoulos, Edgar F. Rauch, 2010 .

Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction.

S. Estradé, F. Peiró, M. Serret, 2012, Micron.