T. Pomorski

Acceptor-oxygen vacancy defect dipoles and fully coordinated defect centers in a ferroelectric perovskite lattice: Electron paramagnetic resonance analysis of Mn2+ in single crystal BaTiO3

C. Randall, R. Maier, P. Lenahan, 2015 .

An Electron Paramagnetic Resonance Study of Defects in Interlayer Dielectrics

Patrick M. Lenahan, Sean W. King, S. King, 2011 .

Defect structure and electronic properties of SiOC:H films used for back end of line dielectrics

Patrick M. Lenahan, Sean W. King, J. Bielefeld, 2014 .

Defects and electronic transport in hydrogenated amorphous SiC films of interest for low dielectric constant back end of the line dielectric systems

Patrick M. Lenahan, Corey J. Cochrane, Sean W. King, 2013 .

Defects in low-κ dielectrics and etch stop layers for use as interlayer dielectrics in ULSI

S. King, P. Lenahan, T. Pomorski, 2010, 2010 IEEE International Integrated Reliability Workshop Final Report.

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability

Markus G. Kuhn, Xin Liu, Patrick M. Lenahan, 2016, Microelectron. Reliab..

Design for metal powder bed fusion: The geometry for additive part selection (GAPS) worksheet

T. Simpson, K. Jablokow, W. Cleary, 2020 .