T. Sasaki

Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle.

H. Sawada, K. Suenaga, F. Hosokawa, 2015, Physical review letters.

Reprint of: Automated geometric aberration correction for large-angle illumination STEM.

H. Sawada, R. Ishikawa, Y. Ikuhara, 2021, Ultramicroscopy.

Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F

H. Sawada, E. Okunishi, Y. Kohno, 2014 .