Ya-Ting Chien

Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistors

Ting‐Chang Chang, T. Tsai, Hui-Chun Huang, 2020, Journal of Physics D: Applied Physics.

Investigation of Electrical Characteristics in Low-Temperature Polycrystalline Silicon Thin-Film Transistors Fabricated at Low-Temperature Process

Ting‐Chang Chang, Sheng-Yao Chou, William Cheng-Yu Ma, 2022, 2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA).

Improving Breakdown Voltage in AlGaN/GaN Metal-Insulator-Semiconductor HEMTs Through Electric-Field Dispersion Layer Material Selection

Fong-Min Ciou, Yu-Ching Tsao, Hao‐Xuan Zheng, 2021, IEEE transactions on device and materials reliability.

Abnormal Degradation Behaviors Under Negative Bias Stress in Flexible p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors After Laser Lift-Off Process

William Cheng-Yu Ma, Yu-Fa Tu, Mao‐Chou Tai, 2023, IEEE Transactions on Electron Devices.

On the Optimization of Performance and Reliability in a-InGaZnO Thin-Film Transistors by Versatile Light Shielding Design

S. Sze, T. Tsai, Yu-Ching Tsao, 2021, IEEE Transactions on Electron Devices.

Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions

T. Tsai, Yu-Ching Tsao, Yu-Fa Tu, 2022, IEEE Electron Device Letters.

Impact of Variant Gate Insulator Fabrication Process on Reliability of Dual-Gate InGaZnO Thin-Film Transistors

T. Tsai, Chih-Hung Tsai, Kuan-Ju Zhou, 2023, IEEE Transactions on Electron Devices.

Performance Enhancement of InGaZnO Top-Gate Thin Film Transistor With Low-Temperature High-Pressure Fluorine Treatment

T. Tsai, Kuan-Ju Zhou, Chuan-Wei Kuo, 2021, IEEE Electron Device Letters.

Performance improvement of Zn0.5Mg0.5O UV sensor by supercritical fluid technology

Wen-Chung Chen, Sheng-Yao Chou, Xin-Ying Tsai, 2023, Materials Science in Semiconductor Processing.