D. Hampton

Defect states with an occupation-dependent lattice configuration in zinc-doped Ga0.58In0.42P on GaAs

M. Wanlass, T. Gfroerer, D. Hampton, 2010, 2010 35th IEEE Photovoltaic Specialists Conference.

AX-type defects in zinc-doped GaAs(1−x)P(x) on GaAs

M. Wanlass, T. Gfroerer, P. Simov, 2010 .

Atomic force microscope integrated with a scanning electron microscope for tip fabrication

H. Hansma, P. Hansma, D. Walters, 1994 .