Lin-Yan Xie

Growth, physical and electrical characterization of nickel oxide thin films prepared by plasma-enhanced atomic layer deposition using nickelocene and oxygen precursors

S. Ding, Wenjun Liu, Xiaohan Wu, 2020, Materials Research Express.

Voltage-Polarity Dependent Programming Behaviors of Amorphous In–Ga–Zn–O Thin-Film Transistor Memory with an Atomic-Layer-Deposited ZnO Charge Trapping Layer

S. Ding, Wenjun Liu, Xiaohan Wu, 2019, Nanoscale Research Letters.