J. Weber

Erratum: In situ spectroscopic ellipsometry during atomic layer deposition of Pt, Ru and Pd (2016 J. Phys. D: Appl. Phys. 49 115504)

M. V. D. van de Sanden, W. Kessels, N. Leick, 2016 .

Implied Open‐circuit Voltage Imaging via a Single Bandpass Filter Method—Its First Application in Perovskite Solar Cells

A. Ho-baillie, Md Arafat Mahmud, Z. Hameiri, 2022, Advanced Functional Materials.

Calculation of quantitative shunt values using photoluminescence imaging

Martin Kasemann, Thorsten Trupke, Otwin Breitenstein, 2012 .

Real time in situ spectroscopic ellipsometry of the growth and plasmonic properties of au nanoparticles on SiO2

M. Verheijen, M. Sanden, M. Creatore, 2012, Nano Research.

Deep learning method for enhancing luminescence image resolution

Z. Hameiri, T. Trupke, P. Dwivedi, 2023, Solar Energy Materials and Solar Cells.

Photoluminescence and electroluminescence imaging of perovskite solar cells

Ziv Hameiri, Martin A. Green, Fuzhi Huang, 2015 .

Effective bulk doping concentration of diffused and undiffused silicon wafers obtained from combined photoconductance and photoluminescence measurements

R. Sinton, Z. Hameiri, T. Trupke, 2012 .