Y. Tada

Load-Deflection and Friction Properties of PEEK Wires as Alternative Orthodontic Wires

T. Hayakawa, Yoshiki Nakamura, Y. Tada, 2017, Materials.

Sulfur-K X-Ray Spectra and Electronic Structure of a Semiconductor Ag2S

I. Umezu, M. Kitamura, S. Muramatsu, 1988 .

Instrumentation adn applications for total refelction x-ray fluorescence spectrometry

T. Arai, Y. Tada, S. Gonsui, 1988 .