Marcelino Seif

Dispersion study of DC and Low Frequency Noise in SiGe: C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications

Sébastien Haendler, Pascal Chevalier, Daniel Gloria, 2014, Microelectron. Reliab..

Improvement of the tolerated raw bit error rate in NAND flash-based SSDs with the help of embedded statistics

Luigi Dilillo, Emna Farjallah, Jean-Marc Armani, 2017, 2017 IEEE International Test Conference (ITC).

Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps

Luigi Dilillo, Emna Farjallah, Jean-Marc Armani, 2017, 2017 22nd IEEE European Test Symposium (ETS).

Study of low frequency noise in advanced SiGe:C heterojunction bipolar transistors

Sébastien Haendler, Pascal Chevalier, Daniel Gloria, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).