Teun Nevels

Novel optical metrology for inspection of nanostructures fabricated by substrate conformal imprint lithography

J. Rivas, M. Verschuuren, M. Ramezani, 2022, Journal of Optics.

Mechanistic description of the efficiency loss in organic phosphorescent host–guest systems due to triplet-polaron quenching

R. Coehoorn, C. Weijtens, P. Bobbert, 2021 .