Philippe Dupuy

发表

Mechanisms of power module source metal degradation during electro-thermal aging

R. Ruffilli, Mounira Berkani, Philippe Dupuy, 2017, Microelectron. Reliab..

power generation system for a dual-voltage network

Philippe Dupuy, Didier Richer, 1999 .

Cathode short structure to enhance the robustness of bidirectional power MOSFETs

Philippe Dupuy, Tanuj Saxena, Vishnu Khemka, 2018, 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue

Philippe Dupuy, Marc Legros, Patrick Tounsi, 2005, Microelectron. Reliab..

Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter

Philippe Dupuy, Gerard Coquery, Richard Lallemand, 2001, Microelectron. Reliab..

In-depth investigation of metallization aging in power MOSFETs

R. Ruffilli, Mounira Berkani, Philippe Dupuy, 2015, Microelectron. Reliab..

CITY AUTOMATED TRANSPORT SYSTEM (CATS): THE LEGACY OF AN INNOVATIVE EUROPEAN PROJECT

Shlomo Bekhor, Leonid Tartakovsky, Philippe Dupuy, 2015 .

3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions

Michele Riccio, Andrea Irace, Mounira Berkani, 2014, Microelectron. Reliab..

3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs

Philippe Dupuy, Patrick Tounsi, Jean-Marie Dorkel, 2011, Microelectron. Reliab..

Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue

Philippe Dupuy, Marc Legros, Colette Levade, 2010, Microelectron. Reliab..

Characterization of ageing failures on power MOSFET devices by electron and ion microscopies

Philippe Dupuy, Marc Legros, Colette Levade, 2009, Microelectron. Reliab..

Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications

Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, 2013, Microelectron. Reliab..

Power generating system for a double-voltage grid

Philippe Dupuy, Didier Richer, 2000 .

Aluminum metallization and wire bonding aging in power MOSFET modules

Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, 2018 .

Alterations induced in the structure of intelligent power devices by extreme electro-thermal fatigue

Philippe Dupuy, Marc Legros, Colette Levade, 2007 .