Gianluca Gulleri

Theoretical evaluation of zirconia and hafnia as gate oxides for si microelectronics.

V. Fiorentini, Gianluca Gulleri, 2002, Physical review letters.

Theoretical evaluation of zirconia and hafnia as gate oxides for si microelectronics.

V. Fiorentini, Gianluca Gulleri, 2002, Physical review letters.

Optical characterization of polysilazane based silica thin films on silicon substrates

F. Fumagalli, R. Corpino, P. Ricci, 2013 .

Mechanical stress in silicon nanosized architectures: Defects of SOD processed silica filler

F. Fumagalli, R. Corpino, P. Ricci, 2014 .