Oliver C. Wells

发表

Applications of image diagnostics to metrology quality assurance and process control

Alexander Starikov, James E. Potzick, Mark P. Davidson, 2003, SPIE Advanced Lithography.

Top-down topography of deeply etched silicon in the scanning electron microscope

Conal E. Murray, Oliver C. Wells, Jonathan L. Rullan, 2004 .

Imaging and analysis of subsurface Cu interconnects by detecting backscattered electrons in the scanning electron microscope

Oliver C. Wells, M. Kawasaki, L. Gignac, 2005 .

Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells, O. Wells, 2006 .

The History and Future of the SEM – A Personal View.

Oliver C. Wells, 2006, Microscopy and Microanalysis.

High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects

Masahiro Kawasaki, Oliver C. Wells, M. Kawasaki, 2005 .

Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)

A. N. Broers, Oliver C. Wells, A. Broers, 1973 .

Backscattered Electron Imaging in the Scanning Electron Microscope: the Use of Either: (a) High Incident Energy or (b) an Array Detector

Conal E. Murray, Oliver C. Wells, C-K. Hu, 2008, Microscopy and Microanalysis.

NEW CONTRAST MECHANISM FOR SCANNING ELECTRON MICROSCOPE

Oliver C. Wells, O. Wells, 1970 .

Coating, Mechanical Constraints, and Pressure Effects on Electromigration

Oliver C. Wells, F. d'Heurle, O. Wells, 1972 .

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Oliver C. Wells, K.C.A. Smith, Dennis McMullan, 2008 .