Ki-Seon Kim

Property of Focal Spot of Electron Beam Depending on the Anode Angle of X-ray Tube Using a Finite Element Method

Sang-Suk Lee, Young-Il Noh, Tae-Young Park, 2015 .

A novel doping technology for ultra-shallow junction fabrication : boron diffusion from boron-adsorbed layer by rapid thermal annealing

Mitsumasa Koyanagi, Hiroyuki Kurino, Kazuhiro Hane, 2000 .

RHEED-AES observation of In desorption on a single-domain Si(001)-(1×2) surface

Y. Takakuwa, S. Kono, T. Abukawa, 1998 .

Real-time monitoring of the Si carbonization process by a combined method of reflection high-energy electron diffraction and Auger electron spectroscopy

Y. Takakuwa, R. Kosugi, S. Kono, 1999 .

Reflection High Energy Electron Diffraction and Auger Electron Spectroscopy (RHEED-AES) Observation of Bi Desorption from a Single-Domain Si(001)2×1-Bi Surface

Y. Takakuwa, Ki-Seon Kim, Yuji Mori Yuji Mori, 1996 .

RHEED-AES observation of Sb surface segregation during Sb-mediated Si MBE on Si(0 0 1)

Y. Takakuwa, S. Kono, T. Abukawa, 1998 .

STRUCTURE OF Si(001)-(4×3)-In SURFACE STUDIED BY X-RAY PHOTOELECTRON DIFFRACTION

J. Tani, M. Shimomura, S. Kono, 1999 .