M. McManus

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling

Franco Stellari, Alan J. Weger, Peilin Song, 2003, Microelectron. Reliab..

Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis [CMOS IC latchup]

P. Song, A. Weger, F. Stellari, 2004, Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).

Oxidation of amorphous NiZr sputtered films

E. Sacher, R. Cochrane, M. McManus, 1991 .

Testing and diagnostics of CMOS circuits using light emission from off-state leakage current

M.B. Ketchen, J.C. Tsang, F. Stellari, 2004, IEEE Transactions on Electron Devices.

Optical diagnosis of excess IDDQ in low power CMOS circuits

Franco Stellari, Peilin Song, Moyra K. McManus, 2002, Microelectron. Reliab..

Optical and electrical testing of latchup in I/O interface circuits

Franco Stellari, Alan J. Weger, Peilin Song, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup

Alan J. Weger, Steven H. Voldman, Moyra K. McManus, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor

Franco Motika, Peilin Song, Mary P. Kusko, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Diagnosis and characterization of timing-related defects by time-dependent light emission

Leendert M. Huisman, Franco Motika, Moyra K. McManus, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

An advanced optical diagnostic technique of IBM z990 eServer microprocessor

Franco Stellari, Alan J. Weger, Peilin Song, 2005, IEEE International Conference on Test, 2005..

Design for low power and power management in IBM Blue Gene/Q

Philip Heidelberger, Chen-Yong Cher, John A. Gunnels, 2013, IBM J. Res. Dev..