J. Gonchond

Thin films interfacial adhesion characterization by Cross-Sectional Nanoindentation: Application to pad structures

V. Fiori, S. Gallois-Garreignot, D. Nélias, 2009, 2009 11th Electronics Packaging Technology Conference.

Study of the Crystalline to Amorphous Silicon Boundary Following Laser Induced Solid Phase Epitaxy.

G. Rozgonyi, D. Bois, J. Gonchond, 1981 .