T. Fujioka

Characterization of chemical bonding features at metal/GeO2 Interfaces by X-ray photoelectron spectroscopy

S. Higashi, S. Miyazaki, H. Murakami, 2011 .

Native Oxidation Growth on Ge(111) and (100) Surfaces

S. K. Sahari, K. Makihara, S. Higashi, 2011 .

Effects of inserting ultrathin TaOx layer in Pt/TiO2 interface on resistive switching characteristics

S. Higashi, S. Miyazaki, Y. Goto, 2011, 2011 International Meeting for Future of Electron Devices.

X-ray Photoelectron Spectroscopy Study of Interfacial Reactions between Metal and Ultrathin Ge Oxide

S. Higashi, S. Miyazaki, H. Murakami, 2011 .

Characterization of Interfaces between Chemically Cleaned or Thermally Oxidized Germanium and Metals

S. Higashi, S. Miyazaki, H. Murakami, 2010 .

Characterization of Ultrathin Ta-oxide Films Formed on Ge(100) by ALD and Layer-by-Layer Methods

S. K. Sahari, S. Higashi, S. Miyazaki, 2013 .