Chi-Wei Wu

Analysis of anomalous traps measured by charge pumping technique in HfO2/metal gate n-channel metal-oxide-semiconductor field-effect transistors

S. Sze, O. Cheng, Ting‐Chang Chang, 2012 .

The Film Thickness Effect on Electrical Conduction Mechanisms and Characteristics of the Ni–Cr Thin Film Resistor

Kuan‐Chang Chang, Ting‐Chang Chang, T. Tsai, 2016, IEEE Journal of the Electron Devices Society.

Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1−xO2 and HfO2/Metal Gate Stacks

S. Sze, O. Cheng, Ting‐Chang Chang, 2013 .

Analysis of an anomalous hump in gate current after dynamic negative bias stress in HfxZr1-xO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors

S. Sze, O. Cheng, Ting‐Chang Chang, 2012 .