Thomas S. Barnett

Product Yield Prediction System and Critical Area Database

Alan J. Weger, Thomas S. Barnett, Jeanne P. Bickford, 2008 .

Combining negative binomial and Weibull distributions for yield and reliability prediction

Adit D. Singh, Matt Grady, Kathleen G. Purdy, 2006, IEEE Design & Test of Computers.

Extending integrated-circuit yield-models to estimate early-life reliability

Adit D. Singh, Victor P. Nelson, Thomas S. Barnett, 2003, IEEE Trans. Reliab..

Burn-in failures and local region yield: an integrated field-reliability model

Adit D. Singh, Victor P. Nelson, Thomas S. Barnett, 2001, Proceedings 19th IEEE VLSI Test Symposium. VTS 2001.

Exploiting defect clustering for yield and reliability prediction

Kathleen G. Purdy, Thomas S. Barnett, Matthew S. Grady, 2005 .

Yield and reliability prediction for DSM circuits

Adit D. Singh, Thomas S. Barnett, 2006 .

Relating yield models to burn-in fall-out in time

Adit D. Singh, Thomas S. Barnett, A. Singh, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Estimating burn-in fall-out for redundant memory

Adit D. Singh, Victor P. Nelson, Thomas S. Barnett, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

Yield-reliability modeling for fault tolerant integrated circuits

Adit D. Singh, Victor P. Nelson, Thomas S. Barnett, 2001, Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Redundancy implications for early-life reliability: experimental verification of an integrated yield-reliability model

Adit D. Singh, Matt Grady, Kathleen G. Purdy, 2002, Proceedings. International Test Conference.

Yield-reliability modeling: experimental verification and application to burn-in reduction

Adit D. Singh, Matt Grady, Kathleen G. Purdy, 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

2 - Keynote Address: Next Generation Semiconductor Factory: Challenges and Opportunities

Mark Nelson, Christopher Hess, Jason D. Hibbeler, 2007 .