Jeanne P. Bickford

Product Yield Prediction System and Critical Area Database

Alan J. Weger, Thomas S. Barnett, Jeanne P. Bickford, 2008 .

Methodology for balancing design and process tradeoffs for deep-subwavelength technologies

Lee Wang, Ioana Graur, Dureseti Chidambarrao, 2011, Advanced Lithography.

Guest Editorial Special Section on the 2016 SEMI Advanced Semiconductor Manufacturing Conference

Oliver D. Patterson, Paul Werbaneth, Jeanne P. Bickford, 2017 .

Method and structure to reduce leakage for ESD device: ET/ID: Enabling technologies and innovative devices

Mujahid Muhammad, Jeanne P. Bickford, Ahmed Y. Ginawi, 2017, ASMC 2017.

Advanced techniques for design assembly and characterization for the 14nm node with LFD using a black box API

Andres Torres, Suniti Kanodia, Juliann Opitz, 2012, Advanced Lithography.

Using Selective Voltage Binning to Maximize Yield

Jeanne P. Bickford, Susan K. Lichtensteiger, 2013 .

Terminal metal inspection yield improvement YE: Yield enhancement

Jeanne P. Bickford, 2017, ASMC 2017.