Yi-Hsuan Chu

Integration of paper-based microarray and time-of-flight secondary ion mass spectrometry (ToF-SIMS) for parallel detection and quantification of molecules in multiple samples automatically.

J. Shyue, Yun-Wen You, Po-Chun Chen, 2018, Analytica chimica acta.

Effect of energy per atom (E/n) on the Ar gas cluster ion beam (Ar-GCIB) and O2+ cosputter process.

J. Shyue, Yun-Wen You, Yiwei Lee, 2019, The Analyst.

Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2(+) cosputtering.

J. Shyue, Yun-Wen You, Hsun-Yun Chang, 2016, The Analyst.

Effect of surface potential on extracellular matrix protein adsorption.

Wei-Lun Kao, Jing-Jong Shyue, J. Shyue, 2014, Langmuir : the ACS journal of surfaces and colloids.