Pons

In situ characterization of the illuminated silicon-electrolyte interface by Fourier-transform infrared spectroscopy.

Peter, Blackwood, Pons, 1989, Physical review letters.

A new method for measuring diffusion coefficients by 2D NMR using accordion spectroscopy

Pons, Millet, 1998, Journal of magnetic resonance.

Internal Material Flow Layers in AA6082-T6 Butt-Joints during Bobbin Friction Stir Welding

Pons, Clucas, Tamadon, 2019, Metals.

Thiolation of Maghemite Nanoparticles by Dimercaptosuccinic Acid

A. Bée, J. Roger, J. Pons, 1997, Journal of colloid and interface science.