J. Cho

Application of Nano-Scale Eels Spectrum Lines To Grain Boundaries

H. M. Chan, J. Bruley, J. Cho, 1997, Microscopy and Microanalysis.

Grain size dependence of electromigration‐induced failures in narrow interconnects

Carl V. Thompson, C. Thompson, J. Cho, 1989 .

Electromigration-induced failures in interconnects with bimodal grain size distributions

Carl V. Thompson, J. Cho, J. Cho, 1990 .