H. Hada
发表
N. Kasai,
Y. Katoh,
K. Tsuji,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
T. Sakamoto,
N. Banno,
M. Tada,
2011,
IEEE Transactions on Electron Devices.
S. Takahashi,
Y. Maejima,
K. Amanuma,
2000,
2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056).
N. Kasai,
N. Sakimura,
K. Mori,
2007,
IEEE Journal of Solid-State Circuits.
N. Kasai,
Y. Katoh,
H. Hada,
2008,
IEEE Transactions on Semiconductor Manufacturing.
N. Kasai,
T. Sakamoto,
N. Iguchi,
2010,
2010 Symposium on VLSI Technology.
H. Aikawa,
T. Kajiyama,
S. Miura,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
N. Sakimura,
N. Iguchi,
N. Banno,
2010,
2010 International Electron Devices Meeting.
M. Yoshikawa,
Y. Fukuzumi,
S. Tahara,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
N. Sakimura,
S. Miura,
S. Tahara,
2003,
2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC..
N. Tanabe,
S. Ohya,
H. Hada,
1992,
1992 International Technical Digest on Electron Devices Meeting.
N. Sakimura,
S. Miura,
S. Tahara,
2002,
2002 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.02CH37302).