Toshihiro Matsuda

发表

A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET

Takayuki Morishita, Kiyotaka Komoku, Hideyuki Iwata, 2006, IEICE Trans. Electron..

Takayuki Morishita, Kiyotaka Komoku, Hideyuki Iwata, 2007, IEICE Trans. Electron..

A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width

Takayuki Morishita, Kiyotaka Komoku, Hideyuki Iwata, 2007, IEICE Trans. Electron..

A test structure for two-dimensional analysis of MOSFETs by hot-carrier-induced photoemission

Kyoji Yamashita, Hiroaki Takeuchi, Akira Muramatsu, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).

A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs

Kazuhiro Morita, Takayuki Morishita, Kiyotaka Komoku, 2008, IEICE Trans. Electron..

A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit

Shigeki Nakajima, Shinya Yamamoto, Hideyuki Iwata, 2005, IEICE Trans. Electron..

A combined test structure with ring oscillator and inverter chain for evaluating optimum high-speed/low-power operation

Kyoji Yamashita, Takashi Ohzone, Toshihiro Matsuda, 2003, International Conference on Microelectronic Test Structures, 2003..

Visible Electroluminescence from MOS Capacitors with Si-Implanted SiO_2(Special Issue on Electronic Displays)

Hideyuki Iwata, Takashi Ohzone, Toshihiro Matsuda, 2002 .

A VDD independent temperature sensor circuit with scaled CMOS process

K. Suzuki, Hideyuki Iwata, Takashi Ohzone, 2009, 2009 Asia and South Pacific Design Automation Conference.

Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide

Takayuki Morishita, Kiyotaka Komoku, Hideyuki Iwata, 2009, IEICE Trans. Electron..

Influence of asymmetric/symmetric source/drain region on asymmetry and mismatch of CMOSFET's and circuit performance

Shinji Odanaka, Toshihiro Matsuda, T. Ohzone, 1998 .

A V_ and Temperature Independent CMOS Voltage Reference Circuit

Hideyuki Iwata, Ryuichi Minami, Takashi Ohzone, 2004 .

Analysis of Temperature Distribution in Stacked IC With On-Chip Sensing Device Arrays

Masaru Ishizuka, Tomoyuki Hatakeyama, Hideyuki Iwata, 2015, IEEE Transactions on Semiconductor Manufacturing.

Fowler–Nordheim tunneling in MOS capacitors with Si-implanted SiO2

Toshihiro Matsuda, T. Ohzone, Etsumasa Kameda, 1998 .