Ton J. Mouthaan

发表

Nonisothermal device simulation using the 2D numerical process/device simulator TRENDY and application to SOI-devices

Gerhard K. M. Wachutka, Philip B. M. Wolbert, Benno H. Krabbenborg, 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Competencies of BSc and MSc programmes in electrical engineering and student portfolios

Ton J. Mouthaan, Henk Vos, R. W. Brink, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002.

Development of engineering competencies: A feedback method for use in a reflective digital portfolio

Lisa Gommer, Ton J. Mouthaan, Henk Vos, 2002 .

Internationalisation of masters education; globalisation at work

Ton J. Mouthaan, Anke Kohl, A. Kohl, 2006, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06).

SEAS: a simulated evolution approach for analog circuit synthesis

H. Wallinga, Ton J. Mouthaan, Zhen-Qiu Ning, 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.

Study on the influence of package parasitics and substrate resistance on the Charged Device Model(CDM) failure levels - possible protection methodology

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2003 .

Zapping thin film transistors

Ton J. Mouthaan, Fred G. Kuper, N. Tosic Golo, 2002, Microelectron. Reliab..

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2003, Microelectron. Reliab..

Investigations on double-diffused MOS transistors under ESD zap conditions

Gianluca Boselli, Ton J. Mouthaan, Fred G. Kuper, 2001, Microelectron. Reliab..

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2002, Microelectron. Reliab..

The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors

Ton J. Mouthaan, Fred G. Kuper, N. Tosic Golo, 2001, Microelectron. Reliab..

Competence-based EE-learning: (how) can we implement it?

Wouter Olthuis, Ton J. Mouthaan, Henk Vos, 2003, Proceedings 2003 IEEE International Conference on Microelectronic Systems Education. MSE'03.

CreaTe: A New Programme to Attract Engineers as Design Artists

Zsófia Ruttkay, Ton J. Mouthaan, 2008, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008).

A case study of a microsystems MSc curriculum

Ton J. Mouthaan, 2004, Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications.

Optimisation of a Solar Cell

Cora Salm, Jan Hensgens, Ton J. Mouthaan, 1998 .

Microelectronics education : proceedings of the 2nd European Workshop held in Noordwijkerhout, The Netherlands, 14-15 May 1998

Cora Salm, Ton J. Mouthaan, 1998 .

The modeling of resistance changes in the early phase of electromigration

Ton J. Mouthaan, V. Petrescu, V. Petrescu, 1998 .

A 3-D Circuit Model to evaluate CDM performance of ICs

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2005, Microelectron. Reliab..

Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures

H. C. de Graaff, Benno H. Krabbenborg, Ton J. Mouthaan, 1996, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Analysis of the electrical breakdown in hydrogenated amorphous silicon thin-film transistors

Ton J. Mouthaan, Fred G. Kuper, F. Kuper, 2002 .

Reliability of flip chip on board. First order model for the effect on contact integrity of moisture penetration in the underfill

J.F.J.M. Caers, J. F. Verweij, Ton J. Mouthaan, 1998, 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206).

Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors

Ton J. Mouthaan, Fred G. Kuper, Natasa Tosic Golo, 2002 .

VIPMOS-a novel buried injector structure for EPROM applications

H. Wallinga, G. J. Hemink, Ton J. Mouthaan, 1991 .

Physics of electro-thermal effects in ESD protection devices

Ton J. Mouthaan, B. H. Krabbenborg, Reinier Beltman, 1991 .

Modelling of the reservoir effect on electromigration lifetime

Cora Salm, Ton J. Mouthaan, Fred G. Kuper, 2001, Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).