P. Huang

Characterization of Si‐TaSi2 in situ composites by synchrotron white beam topography and by double axis diffractometry

S. Stock, Z. Rek, B. Ditchek, 1993 .

Properties of the Mo Back Contact for the Formation of a Thin-Film Photovoltaic Absorber

F. Shiou, C. Hsu, S. S. Wang, 2012, Journal of Electronic Materials.

Molecular beam epitaxial growth and structural characterization of ZnS on (001) GaAs

S. Stock, C. Summers, R. Benz, 1988 .

Fabrication of 5 V High-Performance Solid-State Asymmetric Supercapacitor Device Based on MnO2/Graphene/Ni Electrodes

M. Hsieh, Zhong-Yun Hong, Juejing Liu, 2022, Catalysts.

Defect reduction with CMP pad dressing optimization

Wu-Sian Sie, J. Y. Wu, Chun-Lin Chen, 2014, Proceedings of International Conference on Planarization/CMP Technology 2014.

High mobility Ge pMOSFETs with 0.7 nm ultrathin EOT using HfO2/Al2O3/GeOx/Ge gate stacks fabricated by plasma post oxidation

N. Taoka, M. Takenaka, S. Takagi, 2012, 2012 Symposium on VLSI Technology (VLSIT).

Selective deposition of gold nanoparticles on SiO 2 /Si nanowire

J. Sheu, C. C. Chen, P. Huang, 2005 .