D. S. Liu

Numerical study on the bonding tool position, tip profile and planarity angle influences on TAB/ILB interconnection reliability

C. H. Lin, D. S. Liu, Y. C. Chao, 2003, Microelectron. Reliab..

Experimental method and FE simulation model for evaluation of wafer probing parameters

D. S. Liu, M. K. Shih, 2006, Microelectron. J..

On solving multiobjective bin packing problems using evolutionary particle swarm optimization

Kay Chen Tan, Weng Khuen Ho, Chi Keong Goh, 2008, Eur. J. Oper. Res..

A distributed co-evolutionary particle swarm optimization algorithm

Kay Chen Tan, Weng Khuen Ho, D. S. Liu, 2007, 2007 IEEE Congress on Evolutionary Computation.

Measurement and analysis of contact resistance in wafer probe testing

W. H. Huang, D. S. Liu, M. K. Shih, 2007, Microelectron. Reliab..

A competitive and cooperative co-evolutionary approach to multi-objective particle swarm optimization algorithm design

Kay Chen Tan, Chi Keong Goh, D. S. Liu, 2010, Eur. J. Oper. Res..