Jongwook Jeon

发表

Size efficient low‐noise amplifier for 2.4 GHz ISM‐band transceiver

Hyungcheol Shin, Hee-Sauk Jhon, Hakchul Jung, 2009 .

Charge-collection modeling for SER simulation in FinFETs

Jongwook Jeon, Keun-Ho Lee, Udit Monga, 2016, 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

DeepDDI: A Computational Framework for the Prediction of Drug Interactions Using Deep Learning

Jae Yong Ryu, Hyun Uk Kim, Jongwook Jeon, 2019 .

Low power size‐efficient CMOS UWB low‐noise amplifier design

Hyungcheol Shin, Hee-Sauk Jhon, Jongwook Jeon, 2009 .

Quantifying the impact of building envelope condition on energy use

Youngjib Ham, Jongwook Jeon, Jaehyuk Lee, 2019 .

A New Analytical Model for Channel Thermal Noise of Deep-submicron RF MOSFETs

Hyungcheol Shin, Jongwook Jeon, Yujo Yun, 2006 .

Multi-domain compact modeling for GeSbTe-based memory and selector devices and simulation for large-scale 3-D cross-point memory arrays

Jing Wang, Jongwook Jeon, Keun-Ho Lee, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

Design optimization of RF low noise amplifier in twin‐well CMOS process

Hee-Sauk Jhon, Jongwook Jeon, Myunggon Kang, 2017 .

Accurate BEOL statistical modeling methodology with circuit-level multi-layer process variations

Jongwook Jeon, Keun-Ho Lee, SoYoung Kim, 2017, 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Evaluating the Impact of Reflecting the As-Is Building Condition in the BIM-Based Energy Modeling Process on Building Energy Simulations

Youngjib Ham, Jongwook Jeon, 2016 .

Prediction of Process Variation Effect for Ultrascaled GAA Vertical FET Devices Using a Machine Learning Approach

Myounggon Kang, Jongwook Jeon, Hyungcheol Shin, 2019, IEEE Transactions on Electron Devices.

Extremely low power LNA biased with 0.25-V drain-to-source voltage for 3-to-5 GHz UWB-IR application

Hee-Sauk Jhon, Jongwook Jeon, Myunggon Kang, 2017, Microelectron. J..

Analytical thermal noise model suitable for circuit design using short-channel MOSFETs

In Man Kang, Hyungcheol Shin, Kwyro Lee, 2005, 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers.

Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design

Hyungcheol Shin, Jongwook Jeon, Byung-Gook Park, 2009, IEICE Trans. Electron..

Temporal Noise Analysis and Reduction Method in CMOS Image Sensor Readout Circuit

Hyungcheol Shin, Jongwook Jeon, Bong Chan Kim, 2009, IEEE Transactions on Electron Devices.

Circuit Level Layout Optimization of MOS Transistor for RF and Noise Performance Improvements

Myounggon Kang, Jongwook Jeon, 2016, IEEE Transactions on Electron Devices.

Analytical Noise Parameter Model of Short-Channel RF MOSFETs

Jongwook Jeon, Byung-Gook Park, Jong Duk Lee, 2007 .

The Meanings and Prospects of Primo Vascular System from the Viewpoint of Historical Context

Jongwook Jeon, Sanghun Lee, Jongwook Jeon, 2013, Evidence-based complementary and alternative medicine : eCAM.

An analytical channel thermal noise model for deep-submicron MOSFETs with short channel effects

Jongwook Jeon, Byung-Gook Park, Jong Duk Lee, 2007 .

Small-signal modeling of MOSFET cascode with merged diffusion

Jaehong Lee, Hee-Sauk Jhon, Jongwook Jeon, 2009 .

A Simple Figure of Merit of RF MOSFET for Low-Noise Amplifier Design

Hyungcheol Shin, Hee-Sauk Jhon, Jongwook Jeon, 2008, IEEE Electron Device Letters.

Mismatch circuit aging modeling and simulations for robust product design and pre-/post-silicon verification

Jongwook Jeon, Sangwoo Pae, Jongwoo Park, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Investigation of Thermal Noise Factor in Nanoscale MOSFETs

Hyungcheol Shin, Jongwook Jeon, Byung-Gook Park, 2010 .

A New Noise Parameter Model of Short-Channel MOSFETs

In Man Kang, Hyungcheol Shin, Jongwook Jeon, 2007, 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium.

Modeling of Lateral Migration Mechanism During the Retention Operation in 3D NAND Flash Memories

Myounggon Kang, Hyungcheol Shin, Jaeyeol Park, 2019, 2019 Electron Devices Technology and Manufacturing Conference (EDTM).

Analytical Thermal Noise Model of Deep-submicron MOSFETs

Hyungcheol Shin, Jongwook Jeon, Se Young Kim, 2006 .

Development of Organic Semiconductors Based on Quinacridone Derivatives for Organic Field-Effect Transistors: High-Voltage Logic Circuit Applications

Myounggon Kang, Jongwook Jeon, Yong Jin Jeong, 2017, IEEE Journal of the Electron Devices Society.

Accurate Compact Modeling for Sub-20-nm nand Flash Cell Array Simulation Using the PSP Model

Myounggon Kang, Chilhee Chung, Jongwook Jeon, 2012, IEEE Transactions on Electron Devices.

Investigation of Electrothermal Behaviors of 5-nm Bulk FinFET

Myounggon Kang, Hee-Sauk Jhon, Jongwook Jeon, 2017, IEEE Transactions on Electron Devices.

Effect of polysilicon gate on the flatband voltage shift and mobility degradation for ALD-Al/sub 2/O/sub 3/ gate dielectric

Jongwook Jeon, Moosung Kim, Nae-In Lee, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

A novel tensile Si (n) and compressive SiGe (p) dual-channel CMOS FinFET co-integration scheme for 5nm logic applications and beyond

Jongwook Jeon, Sun-Ghil Lee, Mark S. Rodder, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

Compact Model Strategy of Metal-Gate Work-Function Variation for Ultrascaled FinFET and Vertical GAA FETs

Myounggon Kang, Hyungcheol Shin, Jongwook Jeon, 2019, IEEE Transactions on Electron Devices.