R. Schoedel

Thermal expansion and compressibility of single-crystal silicon between 285 K and 320 K

C. Elster, G. Bartl, Jörg Martin, 2020, Measurement Science and Technology.

Precise interferometric measurements at single-crystal silicon yielding thermal expansion coefficients from 12° to 28°C and compressibility

Rene Schoedel, Gerhard Boensch, R. Schoedel, 2001, Lasers in Metrology and Art Conservation.