B. Selsmark

发表

Internal Strain of Silicon Studied by X-Ray Energy-Dispersive Diffraction

L. Gerward, J. S. Olsen, C. Cousins, 1982 .

The internal strain parameter of gallium arsenide measured by energy-dispersive X-ray diffraction

L. Gerward, J. S. Olsen, C. Cousins, 1989 .

MEASUREMENTS ON THE g-FACTOR OF SHORT-LIVED EXCITED NUCLEAR STATES WITH THE APPLICATION OF A SUM-TECHNIQUE.

B. Selsmark, O. Dørum, 1971 .

Influence of the incident beam on integrated intensities in X‐ray energy‐dispersive diffractometry

L. Gerward, J. S. Olsen, B. Buras, 1978 .

Energy‐dispersive spectroscopic methods applied to X‐ray diffraction in single crystals

L. Gerward, A. L. Andersen, J. S. Olsen, 1975 .

Surface effects in uniaxially stressed crystals: the internal-strain parameters of silicon and germanium revised

L. Gerward, J. S. Olsen, C. Cousins, 1987 .

Determination of internal strain tensors by energy‐dispersive X‐ray diffraction: Results for Si using the 006 forbidden reflection

L. Gerward, J. S. Olsen, C. Cousins, 1982 .

Determination of the internal strain tensor of germanium

L. Gerward, J. S. Olsen, C. Cousins, 1982 .