Qingzhu Zhang

Process variation dependence of total ionizing dose effects in bulk nFinFETs

Bo Li, Ling Yang, Haibin Wang, 2018, Microelectron. Reliab..

Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment

Bo Li, Ling Yang, Yang Huang, 2018, Microelectron. Reliab..

Ab intio Investigation of the Thermochemistry and Kinetics of the SO2 + O3- → SO3- + O2 Reaction in Aircraft Engines and the Environment

Yisheng Xu, Qingzhu Zhang, Jingtian Hu, 2014, Entropy.