Y. Nishi
发表
E. Morifuji,
D. Patil,
M. Horowitz,
2007,
IEEE Transactions on Electron Devices.
Y. Nishi,
K. Shiraishi,
K. Yamaguchi,
2012,
2012 28th International Conference on Microelectronics Proceedings.
E. Morifuji,
Y. Nishi,
P. Kapur,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
Y. Nishi,
T. Skotnicki,
Dawei Zhang,
2008,
2008 International Conference on Simulation of Semiconductor Processes and Devices.
E. Morifuji,
Y. Nishi,
P. Kapur,
2007,
2007 65th Annual Device Research Conference.
Y. Nishi,
1997,
2nd International Symposium on Plasma Process-Induced Damage.
Y. Nishi,
K. Shiraishi,
B. Magyari-Kope,
2012,
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.
E. Morifuji,
Y. Nishi,
P. Kapur,
2007,
IEEE Transactions on Electron Devices.
Y. Nishi,
P. Kapur,
R.S. Shenoy,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
Y. Nishi,
Y. Nishi,
1996,
1996 Symposium on VLSI Circuits. Digest of Technical Papers.
Y. Nishi,
B. Magyari-Kope,
S.G. Park,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
S. Koveshnikov,
Y. Nishi,
G. Bersuker,
2012,
2012 4th IEEE International Memory Workshop.
Y. Nishi,
G. Bersuker,
R. Jammy,
2012,
2012 4th IEEE International Memory Workshop.
Y. Nishi,
I. Nojima,
Yukimasa Uchida,
1972
.
Y. Nishi,
S. Fujita,
T.H. Lee,
2007,
IEEE Transactions on Electron Devices.
Y. Nishi,
J. S. Kim,
T. Y. Lee,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
B. DeSalvo,
S. Jeannot,
Y. Nishi,
2014,
2014 IEEE International Electron Devices Meeting.
Y. Nishi,
E. Vianello,
G. Molas,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Y. Nishi,
Y. Nishi,
M. Kashiwagi,
1980,
IEEE Transactions on Electron Devices.
S. Koveshnikov,
Y. Nishi,
G. Bersuker,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
Y. Nishi,
Yun Bai,
S.S. Wong,
2008,
IEEE Electron Device Letters.
Y. Nishi,
K. Saraswat,
Y. Nishi,
2006,
2006 International Conference on Simulation of Semiconductor Processes and Devices.
Y. Nishi,
J. Jameson,
2008,
2008 9th International Conference on Solid-State and Integrated-Circuit Technology.
Y. Nishi,
Yun Sun,
M. Kobayashi,
2006,
2009 Symposium on VLSI Technology.
Y. Nishi,
R. Brennan,
S.-L. Cheng,
2010,
2010 International Electron Devices Meeting.
Y. Nishi,
J. Vuckovic,
Y. Nishi,
2005,
2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference.
Y. Nishi,
A. Kinoshita,
K. Saraswat,
2008,
2008 Symposium on VLSI Technology.
Y. Nishi,
K. Uchida,
Z. Krivokapic,
2006,
IEEE Transactions on Electron Devices.
Y. Nishi,
S. Gupta,
W. P. Maszara,
2012,
2012 International Silicon-Germanium Technology and Device Meeting (ISTDM).
Y. Nishi,
Yuan Zhang,
H. Jagannathan,
2008,
IEEE Transactions on Electron Devices.
Y. Nishi,
P. Majhi,
L. Colombo,
2005,
IEEE Electron Device Letters.
Y. Nishi,
Y. Nishi,
S. Yamanaka,
1989
.
Y. Nishi,
Y. Nishi,
S. Yamanaka,
1990
.
S. Koveshnikov,
Y. Nishi,
G. Bersuker,
2011,
2011 IEEE International Integrated Reliability Workshop Final Report.
Y. Nishi,
Sung-Joo Hong,
Jaeyun Yi,
2008,
2008 9th Annual Non-Volatile Memory Technology Symposium (NVMTS).