J. Vobecký

发表

Dynamic avalanche in diodes with local lifetime control by means of palladium

Pavel Hazdra, J. Vobecký, 2008, Microelectron. J..

The properties of aluminum, platinum silicide and copper based contacts for silicon high-power devices

J. Vobecký, D. Kolesnikov, 2006, Microelectron. J..

Axial lifetime control in silicon power diodes by irradiation with protons, alphas, low- and high-energy electrons

Pavel Hazdra, J. Vobecký, H. Dorschner, 2004, Microelectron. J..

Molybdenum and low-temperature annealing of a silicon power P-i-N diode

J. Vobecký, V. Komarnitskyy, V. Záhlava, 2011, Microelectron. Reliab..

Doping compensation for increased robustness of fast recovery silicon diodes

J. Vobecký, V. Komarnitskyy, V. Záhlava, 2010, Microelectron. Reliab..

TCAD study of DLC coatings for large-area high-power diodes

Antonio Gnudi, Giorgio Baccarani, Susanna Reggiani, 2018, Microelectron. Reliab..

Reliability of Contacts for Press-Pack High-Power Devices

J. Vobecký, D. Kolesnikov, 2005, Microelectron. Reliab..

Advanced Local Lifetime Control for Higher Reliability of Power Devices

Pavel Hazdra, J. Vobecký, 2003, Microelectron. Reliab..

High-power silicon P-i-N diode with cathode shorts: The impact of electron irradiation

J. Vobecký, L. Pína, J. Vobecký, 2013, Microelectron. Reliab..