I. Tamura

High performance copper and low-k interconnect technology fully compatible to 90nm-node SOC application (CMOS4)

K. Sunouchi, M. Inohara, I. Tamura, 2002, Digest. International Electron Devices Meeting,.

Impact of pattern density on plasma damage of CMOS LSIs

K. Sato, M. Kakumu, K. Miyamoto, 1996, International Electron Devices Meeting. Technical Digest.

A single-chip 8-band CMOS transceiver for W-CDMA(HSPA) / GSM(GPRS) / EDGE with digital interface

G. Takemura, S. Kawaguchi, Y. Tsuda, 2008, ESSCIRC 2008 - 34th European Solid-State Circuits Conference.