Vladimir Cherman
发表
Dimitri Linten,
Sandeep Sangameswaran,
Jeroen De Coster,
2010,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010.
Adrian M. Ionescu,
Vladimir Cherman,
Ingrid De Wolf,
2009,
2009 International Semiconductor Conference.
Bart Vandevelde,
Eric Beyne,
Paul Marchal,
2011,
2011 IEEE International Interconnect Technology Conference.
Diederik Verkest,
Eric Beyne,
Hidetoshi Ohnuma,
2015,
Proceedings of the 2015 International Conference on Microelectronic Test Structures.
Eric Beyne,
Martine Baelmans,
Vladimir Cherman,
2017,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
Test structures for characterization of thermal-mechanical stress in 3D stacked IC for analog design
Vladimir Cherman,
Michal Rakowski,
Abdelkarim Mercha,
2010,
2010 International Conference on Microelectronic Test Structures (ICMTS).
Sandeep Sangameswaran,
Jeroen De Coster,
Vladimir Cherman,
2009,
Microtechnologies.