Younghoon Sohn

A new method for wafer quality monitoring using semiconductor process big data

Younghoon Sohn, Hyun Cheol Lee, Yu-Sin Yang, 2017, Advanced Lithography.

Spectroscopic vector analysis for fast pattern quality monitoring

Chihoon Lee, Younghoon Sohn, Yu-Sin Yang, 2018, Advanced Lithography.

Wafer defect analysis and monitoring method using process big data

Sang-Kil Lee, Insoo Cho, Younghoon Sohn, 2013 .

A scanning laser source and a microcantilever ultrasound receiver for detection of surface flaws in microdevices

Sridhar Krishnaswamy, Younghoon Sohn, 2005, SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring.

Mass spring lattice modeling of the scanning laser source technique.

Sridhar Krishnaswamy, Younghoon Sohn, S. Krishnaswamy, 2002, Ultrasonics.

Ultrasonic imaging of small surface-breaking defects using scanning laser source technique

Jan Drewes Achenbach, Sridhar Krishnaswamy, Younghoon Sohn, 2002 .

Interaction of a scanning laser-generated ultrasonic line source with a surface-breaking flaw.

Sridhar Krishnaswamy, Younghoon Sohn, S. Krishnaswamy, 2004, The Journal of the Acoustical Society of America.

Near-field scanning laser source technique and microfabricated ultrasound receiver

Sridhar Krishnaswamy, Younghoon Sohn, 2006 .