C.M. Grens
发表
J. Papapolymerou,
J.D. Cressler,
J.P. Comeau,
2008,
IEEE Journal of Solid-State Circuits.
J.D. Cressler,
Peng Cheng,
C.M. Grens,
2009,
IEEE Transactions on Device and Materials Reliability.
J.D. Cressler,
C.M. Grens,
A.J. Joseph,
2007,
2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.
Qingqing Liang,
J.D. Cressler,
J.M. Andrews,
2007,
IEEE Transactions on Electron Devices.
Peng Cheng,
C.M. Grens,
J.D. Cressler,
2008,
2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.
Qingqing Liang,
J.M. Andrews,
C.M. Grens,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
C.M. Grens,
J.D. Cressler,
A.J. Joseph,
2008,
IEEE Transactions on Electron Devices.
J.M. Andrews,
C.M. Grens,
J. Cressler,
2009,
IEEE Transactions on Electron Devices.
Peng Cheng,
C.M. Grens,
J.D. Cressler,
2009,
IEEE Transactions on Device and Materials Reliability.
C.M. Grens,
J.D. Cressler,
A.J. Joseph,
2006,
2006 Bipolar/BiCMOS Circuits and Technology Meeting.