E. Mays

Transmission fourier transform infra-red spectroscopy investigation of structure property relationships in low-k SiO x C y :H Dielectric thin films

S. King, Han Li, Jessica Xu, 2013 .

Defect structure and electronic properties of SiOC:H films used for back end of line dielectrics

Patrick M. Lenahan, Sean W. King, J. Bielefeld, 2014 .

Mechanical properties of high porosity low-k dielectric nano-films determined by Brillouin light scattering

Sean W. King, Ratnasingham Sooryakumar, David J. Michalak, 2013 .

Detection of defect states in low-k dielectrics using reflection electron energy loss spectroscopy

Benjamin French, Sean W. King, S. King, 2013 .

Demonstration of new planar capacitor (PCAP) vehicles to evaluate dielectrics and metal barrier thin films

Narendra V. Lakamraju, J. Bielefeld, R. Kasim, 2015, 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM).

Elastic properties of porous low-k dielectric nano-films

J. Bielefeld, S. King, R. Sooryakumar, 2011 .

The Effect of Edge Compliance on the Contact between a Spherical Indenter and a High-Aspect-Ratio Rectangular Fin

G. Stan, S. King, E. Mays, 2018, Experimental Mechanics.

Nuclear reaction analysis for H, Li, Be, B, C, N, O and F with an RBS check

S. Banerjee, N. Dudney, M. Ritala, 2016 .

Deposition and characterization of zirconium tin titanate thin films as a potential high-k material for electronic devices

D. Hess, W. S. Rees, E. Mays, 2004 .

Correction to: The Effect of Edge Compliance on the Contact between a Spherical Indenter and a High-Aspect-Ratio Rectangular Fin

S. King, E. Mays, H. Yoo, 2019 .

The Effect of Edge Compliance on the Contact between a Spherical Indenter and a High-Aspect-Ratio Rectangular Fin

S. King, E. Mays, H. Yoo, 2018, Experimental mechanics.

Nanoscale tomographic reconstruction of the subsurface mechanical properties of low-k high-aspect ratio patterns

G. Stan, S. King, E. Mays, 2016, Nanotechnology.

Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins

C. Prater, G. Stan, Q. Hu, 2017, Beilstein journal of nanotechnology.